All Reliability, ESD, and Failure study and materials for Integrated Circuit Design
                                                                                                by Martin Chu,
                                                                                               First Created Sept. 16 2010
                                                                                                Last Update Sept. 19 2010

 (Member only, contribution welcome, interested parties please contact Martin Chu  for more information)
Document Name
Area and categogy
Basic Failure_Modes_and_Mechanisms Failure  
Reliability_Issue_MOS_BJT_design Reliability  
Reliability_in_CMOS_design Reliability   
Reliability_Handbook_ADI Reliability  
Quality_reliability_handbook_Sony Quality  
Failure_mechanisms_TI Failure  
Quality_Handbook_Freescale Quality  
ESD_for_advanced_node ESD  
ESD_TI_version ESD  


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